发明名称 Collimation system for dual slice EBT scanner
摘要 An electron beam tomography (EBT) scanning system comprising an electron source generating an electron beam, a target ring that receives the electron beam and emits an x-ray fan beam upon impingement of the electron beam on the target ring, a pair of detector arrays arranged opposite the target ring, and a collimator arranged concentrically between the target ring and the pair of detector arrays. The collimator has interior and exterior walls concentrically arranged with one another and surrounding a patient examination area. The interior and exterior walls have a first set of apertures aligned to collimate the x-ray fan beam into a first collimated beam having a first width and a second collimated beam having a second width. Each collimated beam may form a single or double tomographic slice. The collimated beams are detected by the pair of detector arrays.
申请公布号 US6792077(B2) 申请公布日期 2004.09.14
申请号 US20020064182 申请日期 2002.06.19
申请人 GE MEDICAL SYSTEMS GLOBAL TECHNOLOGY COMPANY, LLC 发明人 RAND ROY E.
分类号 A61B6/03;G21K1/02;G21K5/02;(IPC1-7):G21K1/02 主分类号 A61B6/03
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