发明名称 Methods of patterning resists and structures including the patterned resists
摘要 Methods of patterning resists and structures including the patterned resists are disclosed. A patterned, multi-transmissive mask is used during patterning of resists to control exposure at areas of the resist at which features having different detail are desired. Exposure is varied in more finely patterned and more grossly patterned areas of the resist. The patterned resists have a high degree of topographical uniformity.
申请公布号 US6790598(B2) 申请公布日期 2004.09.14
申请号 US20020046245 申请日期 2002.01.16
申请人 XEROX CORPORATION 发明人 BURKE CATHIE J.;ATKINSON DIANE;CALISTRI-YEH MILDRED
分类号 B05D1/32;B05D3/06;B41J2/16;G03F1/14;G03F7/20;(IPC1-7):G03F7/22 主分类号 B05D1/32
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