发明名称 |
Methods of patterning resists and structures including the patterned resists |
摘要 |
Methods of patterning resists and structures including the patterned resists are disclosed. A patterned, multi-transmissive mask is used during patterning of resists to control exposure at areas of the resist at which features having different detail are desired. Exposure is varied in more finely patterned and more grossly patterned areas of the resist. The patterned resists have a high degree of topographical uniformity.
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申请公布号 |
US6790598(B2) |
申请公布日期 |
2004.09.14 |
申请号 |
US20020046245 |
申请日期 |
2002.01.16 |
申请人 |
XEROX CORPORATION |
发明人 |
BURKE CATHIE J.;ATKINSON DIANE;CALISTRI-YEH MILDRED |
分类号 |
B05D1/32;B05D3/06;B41J2/16;G03F1/14;G03F7/20;(IPC1-7):G03F7/22 |
主分类号 |
B05D1/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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