| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for inspecting a semiconductor element without providing a database outside. SOLUTION: This semiconductor element 101 is equipped with a nonvolatile storage element 102 for holding writably and readably manufacture data in each manufacturing process of the semiconductor element, inspection data at the probe inspection time, and inspection data at the shipping inspection time. COPYRIGHT: (C)2004,JPO&NCIPI
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