发明名称 |
PROJECTION/RECESS DETERMINING METHOD ON SPECIMEN AND CHARGED PARTICLE BEAM DEVICE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a determining method and its device suitable to determine whether it is projecting or recessed on a pattern comprising lines and spaces formed on a specimen. <P>SOLUTION: According to this method and its device, when one foot portion possessed by a peak of a profile formed based on charged particle beam scanning converges slowly in comparison with the other foot portion, a region on the specimen corresponding to the one foot portion is determined to be a projecting part. Or else, when the one foot portion sharply converges in comparison with the other foot portion, a region on the specimen corresponding to the one foot portion is determined to be a recessed part. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p> |
申请公布号 |
JP2004251674(A) |
申请公布日期 |
2004.09.09 |
申请号 |
JP20030040494 |
申请日期 |
2003.02.19 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
KIMURA YOSHIHIRO;KOMURO OSAMU;SASAJIMA JIDAI |
分类号 |
G01B15/04;G01B15/08;G01N23/225;H01J37/28;H01L21/027;H01L21/66;(IPC1-7):G01B15/04 |
主分类号 |
G01B15/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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