发明名称 MANUFACTURE OF AMORPHOUS SILICON DOPED THIN FILM
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method for manufacturing an amorphous silicon doped thin film with which any adverse influence is not exerted upon electric characteristics and light absorption is also suppressed. <P>SOLUTION: In the method for manufacturing the amorphous silicon doped thin film with chemical vapor growth using a silicon-containing gas, a hydrohalic gas or a halogen gas and a doping gas, an optical band gap of the amorphous silicon doped thin film is 1.75eV or more. The hydrohalic gas may also be HF, HCl, HBr or HI, the halogen gas may also be F<SB>2</SB>, Cl<SB>2</SB>, Br<SB>2</SB>or I<SB>2</SB>, and the doping gas may also be a B-containing gas or a P-containing gas. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p>
申请公布号 JP2004253735(A) 申请公布日期 2004.09.09
申请号 JP20030044951 申请日期 2003.02.21
申请人 FUJI ELECTRIC HOLDINGS CO LTD 发明人 TAKANO AKIHIRO
分类号 C23C16/24;H01L21/205;H01L31/04;(IPC1-7):H01L21/205 主分类号 C23C16/24
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