发明名称 |
SAMPLE CONTAINER FOR X-RAY DIFFRACTION MEASUREMENT |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a sample container for X-ray diffraction measurements, which can carry out the X-ray diffraction measurement for a sample over a wide range of temperature and pressure. <P>SOLUTION: The sample container 1 for the X-ray diffraction measurement, which contains a sample being subjected to the X-ray diffraction measurement, is composed of an upper cover 4 and a bottom cover 6 so as to be sealed by them and includes a cylindrical body 2 which can contain the sample therein, and supplying section 4a which supplies a pressurized gas into the body 2. The body 2 is made up of an X-ray transmissive material over its entire circumference. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p> |
申请公布号 |
JP2004251664(A) |
申请公布日期 |
2004.09.09 |
申请号 |
JP20030040094 |
申请日期 |
2003.02.18 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
TANAKA HIDEAKI;TAKEICHI NOBUHIKO;KIYOBAYASHI SATORU;KURIYAMA NOBUHIRO;SENOO HIROSHI |
分类号 |
G01N23/20;(IPC1-7):G01N23/20 |
主分类号 |
G01N23/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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