| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device for enriching the self-testing function of a BIST circuit and reducing chip size or reducing the number of external pins. SOLUTION: The semiconductor device comprises a judgment result outputting circuit that mounts the BIST circuit to a chip and outputs a judgment result by the BIST circuit to an external pin. The judgment result outputting circuit comprises a verification signal generation section for generating a verification signal for indicating the normal operation of the BIST circuit for outputting to the external pin. In an operation test by the BIST circuit equipped with the judgment result outputting circuit, when a BIST enable signal bistenz rises to an H level and the operation test by the BIST circuit is started, a pulse signal flgz is outputted from the external pin as a start flag SF before starting the operation test. Additionally, when the output of all address signals is completed, the pulse signal flgz is outputted from the external pin as the end flag SF. COPYRIGHT: (C)2004,JPO&NCIPI
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