发明名称 |
Quality control of strongly ionized crystals, whereby high energy radiation is used to generated electron-hole pairs in the crystal and the corresponding absorption spectrum measured |
摘要 |
<p>Quality control method, especially for strongly ionized crystals, in which a crystal (14) is irradiated with electromagnetic radiation (13) and reflected radiation (15) within a given wavelength bandwidth is detected. The bandwidth includes an absorption range in which the radiation is absorbed to form electron-hole pairs, with a resultant broad absorption peak detected in the spectrum of the reflected radiation. The width of the peak indicates the quality of the crystal.</p> |
申请公布号 |
DE10307423(A1) |
申请公布日期 |
2004.09.09 |
申请号 |
DE2003107423 |
申请日期 |
2003.02.21 |
申请人 |
SCHOTT GLAS |
发明人 |
LETZ, MARTIN;PARTHIER, LUTZ |
分类号 |
G01N23/203;(IPC1-7):G01N21/41 |
主分类号 |
G01N23/203 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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