发明名称 Quality control of strongly ionized crystals, whereby high energy radiation is used to generated electron-hole pairs in the crystal and the corresponding absorption spectrum measured
摘要 <p>Quality control method, especially for strongly ionized crystals, in which a crystal (14) is irradiated with electromagnetic radiation (13) and reflected radiation (15) within a given wavelength bandwidth is detected. The bandwidth includes an absorption range in which the radiation is absorbed to form electron-hole pairs, with a resultant broad absorption peak detected in the spectrum of the reflected radiation. The width of the peak indicates the quality of the crystal.</p>
申请公布号 DE10307423(A1) 申请公布日期 2004.09.09
申请号 DE2003107423 申请日期 2003.02.21
申请人 SCHOTT GLAS 发明人 LETZ, MARTIN;PARTHIER, LUTZ
分类号 G01N23/203;(IPC1-7):G01N21/41 主分类号 G01N23/203
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