发明名称 Semiconductor device
摘要 The orientation of a crystalline semiconductor film obtained by crystallizing an amorphous semiconductor film is improved and a TFT formed from this crystalline semiconductor film is provided. In a semiconductor device whose TFT is formed from a semiconductor layer mainly containing silicon, the semiconductor layer has a channel formation region and an impurity region doped with an impurity of one type of conductivity. 20% or more of the channel formation region is the {101} lattice plane that forms an angle of equal to or less than 10 degree with respect to the surface of the crystalline semiconductor film, the plane being detected by an electron backscatter diffraction pattern method, 3% or less of the channel formation region is the {001} lattice plane that forms an angle of equal to or less than 10 degree with respect to the surface of the crystalline semiconductor film, 5% or less of the channel formation region is the {111} lattice plane that forms an angle of equal to or less than 10 degree with respect to the surface of the crystalline semiconductor film.
申请公布号 US6787807(B2) 申请公布日期 2004.09.07
申请号 US20010882265 申请日期 2001.06.18
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;MITSUKI TORU;KASAHARA KENJI;ASAMI TAKETOMI;TAKANO TAMAE;SHICHI TAKESHI;KOKUBO CHIHO
分类号 G02F1/1368;G02F1/1362;G09F9/30;G09F9/35;H01L21/20;H01L21/28;H01L21/336;H01L21/77;H01L21/8238;H01L21/84;H01L27/08;H01L27/092;H01L27/12;H01L29/04;H01L29/423;H01L29/49;H01L29/786;(IPC1-7):H01L29/04;H01L29/12;H01L31/036 主分类号 G02F1/1368
代理机构 代理人
主权项
地址