发明名称 X-ray examination apparatus for reconstructing a three-dimensional data set from projection images
摘要 An X-ray examination apparatus includes an X-ray source and an X-ray detector and is arranged to provide a series of projection images at respective orientations of the X-ray source (1) and the X-ray detector (2) relative to a predetermined frame of reference. The orientations of the projection images are calibrated relative to this frame of reference. A basic three-dimensional data set (23) is reconstructed from the projection images. A number of directions of observations (121-123) are calibrated relative to the same frame of reference. One or more additional X-ray images (111-113) are formed for the calibrated directions of observation, that is, preferably at successive instants in time. A dynamic series of three-dimensional data sets is formed by updating the basic three-dimensional data set by means of the additional X-ray images.
申请公布号 US6788759(B2) 申请公布日期 2004.09.07
申请号 US20020215715 申请日期 2002.08.09
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 OP DE BEEK JOHANNES CATHARINA ANTONIUS;KOPPE REINER;KLOTZ ERHARD PAUL ARTUR
分类号 A61B6/00;A61B6/02;G06T1/00;G06T3/00;G06T11/00;(IPC1-7):A61B6/03 主分类号 A61B6/00
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