发明名称 |
X-ray examination apparatus for reconstructing a three-dimensional data set from projection images |
摘要 |
An X-ray examination apparatus includes an X-ray source and an X-ray detector and is arranged to provide a series of projection images at respective orientations of the X-ray source (1) and the X-ray detector (2) relative to a predetermined frame of reference. The orientations of the projection images are calibrated relative to this frame of reference. A basic three-dimensional data set (23) is reconstructed from the projection images. A number of directions of observations (121-123) are calibrated relative to the same frame of reference. One or more additional X-ray images (111-113) are formed for the calibrated directions of observation, that is, preferably at successive instants in time. A dynamic series of three-dimensional data sets is formed by updating the basic three-dimensional data set by means of the additional X-ray images.
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申请公布号 |
US6788759(B2) |
申请公布日期 |
2004.09.07 |
申请号 |
US20020215715 |
申请日期 |
2002.08.09 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
OP DE BEEK JOHANNES CATHARINA ANTONIUS;KOPPE REINER;KLOTZ ERHARD PAUL ARTUR |
分类号 |
A61B6/00;A61B6/02;G06T1/00;G06T3/00;G06T11/00;(IPC1-7):A61B6/03 |
主分类号 |
A61B6/00 |
代理机构 |
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代理人 |
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地址 |
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