发明名称 |
Integrated circuit having a test circuit, and method of decoupling a test circuit in an integrated circuit |
摘要 |
The integrated circuit has a test circuit, which is connected to an input terminal of the integrated circuit via a line connection. An isolating device is provided between an input terminal of the test circuit in order to completely isolate the line connection between the test circuit and the input terminal after the test circuit has performed a test procedure. |
申请公布号 |
US6788087(B2) |
申请公布日期 |
2004.09.07 |
申请号 |
US20020289826 |
申请日期 |
2002.11.07 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
SCHNABEL RAINER FLORIAN |
分类号 |
G01R31/3187;G11C29/48;(IPC1-7):G01R31/02 |
主分类号 |
G01R31/3187 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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