发明名称 Semiconductor laser device
摘要 An n-InP second upper cladding layer is laid on a p-InP lower cladding layer while an active layer having upper and lower boundary surfaces that are uniformly flat in an optical waveguide direction is interposed therebetween. A diffraction layer having a phase-shifted structure in the optical waveguide direction is interposed between the lower cladding layer and the active layer or between the second upper cladding layer and the active layer. The length L of the diffraction grating layer in the direction of the optical waveguide is L<=260 mum; a mean coupling factor kappa of a diffraction grating layer is kappa>=150 cm<-1>; and kappaL satisfies 5.6>kappaL>3.0.
申请公布号 US6788725(B2) 申请公布日期 2004.09.07
申请号 US20010987259 申请日期 2001.11.14
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 AOYAGI TOSHITAKA;SAKAINO GO
分类号 H01S5/062;H01S5/12;H01S5/343;(IPC1-7):H01S3/08 主分类号 H01S5/062
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