发明名称 Fully depleted SOI transistor with elevated source and drain
摘要 A method of manufacturing an integrated circuit utilizes a thin film substrate. The method includes providing a mask structure on a top surface of the thin film, depositing a semiconductor material above the top surface of the thin film and the mask structure, removing the semiconductor material to a level below the top surface of the mask structure, siliciding the semiconductor material, and providing a gate structure in an aperture formed by removing the mask structure. The transistor can be a fully depleted transistor having material for siliciding source and drain regions.
申请公布号 US6787424(B1) 申请公布日期 2004.09.07
申请号 US20010780043 申请日期 2001.02.09
申请人 ADVANCED MICRO DEVICES, INC. 发明人 YU BIN
分类号 H01L21/336;H01L29/417;H01L29/786;(IPC1-7):H01L21/336 主分类号 H01L21/336
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