发明名称 |
METHOD FOR FORMING CAPACITOR TO PREVENT PERMEATION OF LAL SOLUTION |
摘要 |
PURPOSE: A method for forming a capacitor is provided to prevent permeation of LAL solution in a wet-etch process by forming an uneven part between a storage node electrode and an etch-stop layer. CONSTITUTION: An etch-stop layer(218) including the first nitride layer, an oxide layer, and the second nitride layer is formed on a substrate having an exposed conductive pattern. An insulating layer is formed on the etch-stop layer. An opening part is formed by etching the insulating layer and the etch-stop layer. The inside of the etch-stop layer is formed with an uneven part by performing a wet-etch process. A storage node electrode(230a) is formed on the inside and the bottom of the opening part. A dielectric layer(232) and a plate electrode(234) are formed on the surface of the storage node electrode.
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申请公布号 |
KR20040077041(A) |
申请公布日期 |
2004.09.04 |
申请号 |
KR20030012426 |
申请日期 |
2003.02.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, WON JUN;SEO, JUN;SONG, JONG HUI |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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地址 |
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