发明名称 METHOD FOR FABRICATING POLYCRYSTALLINE SILICON LAYER AND TFT FABRICATED THEREBY HAVING GOOD CURRENT CHARACTERISTIC
摘要 PURPOSE: A method for fabricating a polycrystalline silicon layer and a TFT fabricated thereby are provided to increase the width of grains and improve a characteristic of the polycrystalline silicon layer by optimizing an irradiation area of crystalline silicon. CONSTITUTION: An overlapped irradiation area of laser beams is more than 0.5 micrometers while an amorphous silicon layer is crystallized by using the laser beams. A method for fabricating a polycrystalline silicon layer is an SLS(Sequential Lateral Solidification) method. A TFT is fabrication by using the polycrystalline silicon layer. In the TFT, the average width of grains of the polycrystalline silicon layer is more than 0.2 micrometers.
申请公布号 KR20040076751(A) 申请公布日期 2004.09.03
申请号 KR20030012101 申请日期 2003.02.26
申请人 SAMSUNG SDI CO., LTD. 发明人 PARK, HYE HYANG;PARK, JI YONG
分类号 C30B29/06;C30B23/00;C30B25/00;C30B28/12;C30B28/14;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 C30B29/06
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