发明名称 |
METHOD FOR FABRICATING POLYCRYSTALLINE SILICON LAYER AND TFT FABRICATED THEREBY HAVING GOOD CURRENT CHARACTERISTIC |
摘要 |
PURPOSE: A method for fabricating a polycrystalline silicon layer and a TFT fabricated thereby are provided to increase the width of grains and improve a characteristic of the polycrystalline silicon layer by optimizing an irradiation area of crystalline silicon. CONSTITUTION: An overlapped irradiation area of laser beams is more than 0.5 micrometers while an amorphous silicon layer is crystallized by using the laser beams. A method for fabricating a polycrystalline silicon layer is an SLS(Sequential Lateral Solidification) method. A TFT is fabrication by using the polycrystalline silicon layer. In the TFT, the average width of grains of the polycrystalline silicon layer is more than 0.2 micrometers.
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申请公布号 |
KR20040076751(A) |
申请公布日期 |
2004.09.03 |
申请号 |
KR20030012101 |
申请日期 |
2003.02.26 |
申请人 |
SAMSUNG SDI CO., LTD. |
发明人 |
PARK, HYE HYANG;PARK, JI YONG |
分类号 |
C30B29/06;C30B23/00;C30B25/00;C30B28/12;C30B28/14;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
C30B29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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