| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device the continuity test among terminals of which can be executed in a short time independently of the number of the terminals. <P>SOLUTION: A switch element 017 (018 to 021) and a resistive element 022 (023 to 026) are respectively connected in series between the terminals 003 and 004 (004 and 005 to 007 and 008), all the switch elements are made conductive, each of currents flowing between the one terminal and the other terminal between which the switch element and the resistive element are connected in series is measured, and a short circuit fault that may take place among the terminals 003 to 008 is detected in a package through one measurement depending on each of the currents. <P>COPYRIGHT: (C)2004,JPO&NCIPI |
