发明名称 Substrate illumination method with a structural pattern that compensates for the optical proximity effect, for use in semiconductor manufacture wherein serif lengths are reduced by a specified amount
摘要 Method in which a circuit layout is provided with a first structure pattern (200) that is stored in electronic data format and represents a first lithographic plane. A first partial surface (70) is defined as a lower threshold (21) for the length (10) by which a serif (151, 152) to be attached to a structure element (2a, 2b) can fall below a specified value in order to increase the local resolution.
申请公布号 DE10304674(A1) 申请公布日期 2004.09.02
申请号 DE2003104674 申请日期 2003.02.05
申请人 INFINEON TECHNOLOGIES AG 发明人 SCHROEDER, UWE PAUL
分类号 G03F1/00;G03F1/36;G03F7/20 主分类号 G03F1/00
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