发明名称 |
Substrate illumination method with a structural pattern that compensates for the optical proximity effect, for use in semiconductor manufacture wherein serif lengths are reduced by a specified amount |
摘要 |
Method in which a circuit layout is provided with a first structure pattern (200) that is stored in electronic data format and represents a first lithographic plane. A first partial surface (70) is defined as a lower threshold (21) for the length (10) by which a serif (151, 152) to be attached to a structure element (2a, 2b) can fall below a specified value in order to increase the local resolution. |
申请公布号 |
DE10304674(A1) |
申请公布日期 |
2004.09.02 |
申请号 |
DE2003104674 |
申请日期 |
2003.02.05 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
SCHROEDER, UWE PAUL |
分类号 |
G03F1/00;G03F1/36;G03F7/20 |
主分类号 |
G03F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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