发明名称 Etch back of interconnect dielectrics
摘要 An embodiment of the invention is a metal layer 14 of a back-end module 6 where the height of the interconnects 17 is greater than the height of the dielectric regions 20. Another embodiment of the invention is a method of fabricating a semiconductor wafer 4 where the height of the interconnects 17 is greater than the height of the dielectric regions 20.
申请公布号 US2004169279(A1) 申请公布日期 2004.09.02
申请号 US20030712448 申请日期 2003.11.12
申请人 FARBER DAVID G.;TSUI TING;KRAFT ROBERT;HUFFMAN CRAIG 发明人 FARBER DAVID G.;TSUI TING;KRAFT ROBERT;HUFFMAN CRAIG
分类号 H01L21/768;(IPC1-7):H01L23/48 主分类号 H01L21/768
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