发明名称 |
METHOD FOR MANUFACTURING DEVICE, AND DEVICE MANUFACTURED BY USING THE SAME, METHOD FOR MANUFACTURING COMPOSITE SUBSTRATE, ELECTROOPTICAL DEVICE, AND ELECTRONIC APPLIANCE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a device and so on, in which a yield is prevented from being lowered owing to a foreign matter produced by film floating even when the film floating (film peeling) has newly occurred especially through wet etching. SOLUTION: The method for manufacturing the device consists of using a composite substrate S comprising a semiconductor substrate with a semiconductor layer 206a to be a device forming layer and a supporting substrate 10A bonded together and forming the device from the semiconductor layer 206a, and has a plurality of steps to subject the composite substrate S to wet etching treatment. Subsequent to each of the wet etching treatment steps, peripheral edge parts of the semiconductor substrate are removed by dry etching treatment. COPYRIGHT: (C)2004,JPO&NCIPI |
申请公布号 |
JP2004246028(A) |
申请公布日期 |
2004.09.02 |
申请号 |
JP20030035099 |
申请日期 |
2003.02.13 |
申请人 |
SEIKO EPSON CORP |
发明人 |
NAKAMURA TEIICHIRO |
分类号 |
G02F1/1333;G02F1/1368;H01L21/02;H01L21/306;H01L21/336;H01L27/12;H01L29/786;(IPC1-7):G02F1/136;G02F1/133 |
主分类号 |
G02F1/1333 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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