发明名称 Messvorrichtung und Messverfahren
摘要 <p>A measuring apparatus for measuring reliability against jitter of an electronic device, including: a jitter tolerance estimator operable to estimate a jitter tolerance of the electronic device based on an output signal output from the electronic device according to an input signal input through a transmission line of which the transmission length is shorter than a predetermined length so that it does not generate a deterministic jitter; a jitter tolerance degradation quantity estimator operable to estimate a quantity of degradation of the jitter tolerance which deteriorates by the deterministic jitter caused in the input signal by transmission through the long transmission line when the input signal is input into the electronic device through the transmission line, of which the transmission length is longer than a predetermined length so that it may cause the deterministic jitter; a system jitter tolerance estimator operable to estimate a jitter tolerance of the electronic device and a jitter tolerance of a system including the long transmission line and the electronic device based on quantity of degradation of the jitter tolerance, is provided.</p>
申请公布号 DE10392148(T5) 申请公布日期 2004.09.02
申请号 DE2003192148T 申请日期 2003.02.26
申请人 ADVANTEST CORP., TOKIO/TOKYO 发明人 YAMAGUCHI, TAKAHIRO;ISHIDA, MASAHIRO;SOMA, MANI;MUSHA, HIROBUMI
分类号 G01R29/02;G01R29/027;G01R29/26;G01R31/317;G01R31/319;G01R31/3193;H04L1/20;(IPC1-7):H04L1/00 主分类号 G01R29/02
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