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发明名称
Verfahren und Vorrichtung zur Spurfolgefehlerdetektion in einem optischen Plattenlaufwerk
摘要
申请公布号
DE60012432(D1)
申请公布日期
2004.09.02
申请号
DE20006012432
申请日期
2000.06.23
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
MA, BYUNG-IN;PARK, IN-SIK;SEO, JUNG-EON;SHIM, JAE-SEONG
分类号
G11B7/09;(IPC1-7):G11B7/09;G11B7/095
主分类号
G11B7/09
代理机构
代理人
主权项
地址
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