发明名称 Projection exposure method and apparatus and device manufacturing method
摘要 A projection exposure apparatus includes an illumination system (24) for supplying illumination light, a projection optical system (5) for projecting a pattern of a first object (1) onto a second object (9) in cooperation with the illumination light, the projection optical system having a refraction optical element (6,7), a changing system (29-32) for changing a wavelength of the illumination light, a detecting system (19) for detecting a change in pressure, and a control system (23) for controlling the changing system on the basis of an output of the detecting system so as to compensate a change in ratio of refractivity between an atmosphere and the refraction optical element due to a change in pressure. <IMAGE>
申请公布号 EP1452921(A1) 申请公布日期 2004.09.01
申请号 EP20040075655 申请日期 1996.05.09
申请人 CANON KABUSHIKI KAISHA 发明人 SHINONAGA, HIROHIKO;SATO, HIROSHI
分类号 G03F7/20;G03F7/207;H01L21/027 主分类号 G03F7/20
代理机构 代理人
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