发明名称 Internal eddy current inspection
摘要 An eddy current inspection apparatus (10) includes a holder (16) for a specimen (12), a holder (22) for an eddy current probe (20), and an eddy current instrument (32) operatively joined thereto. The probe holder (22) includes carriages (24,26) for translating the probe (20) along first and second axes. The probe holder (22) is selectively moved to align the probe (20) with an internal channel (14) of the specimen (12) for sliding movement therealong to conduct eddy current inspection thereof. <IMAGE>
申请公布号 EP1452863(A1) 申请公布日期 2004.09.01
申请号 EP20040251060 申请日期 2004.02.26
申请人 GENERAL ELECTRIC COMPANY 发明人 FIELD, MICHAEL WAYNE;DIERDORF, JON RUSSEL;JOHNSON, JAMES MICHAEL;DZIECH, MICHAEL LEONARD;MELLORS, ANTHONY WILLIAM
分类号 G01N27/90;(IPC1-7):G01N27/90 主分类号 G01N27/90
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