发明名称 Post-etch cleaning treatment
摘要 The present disclosure relates to a post-etch cleaning treatment (20) for a semiconductor device such as a FeRAM. The treatment comprises providing an etchant comprising both a fluorine compound and a chlorine compound, and applying the etchant to the semiconductor device in a wet cleaning process. <IMAGE>
申请公布号 EP1453084(A2) 申请公布日期 2004.09.01
申请号 EP20040012769 申请日期 2001.08.07
申请人 AGILENT TECHNOLOGIES INC. (A DELAWARE CORPORATION) 发明人 WILLS MIRKARIMI, LAURA;GILBERT, STEPHEN R.;XING, GUOQIANG;SUMMERFELT, SCOTT;SAKODA, TOMOYUKI;MOISE, THEODORE
分类号 H01L21/02;H01L21/308;H01L21/304;H01L21/306;H01L21/311;H01L21/3213;H01L21/8246;H01L27/105;(IPC1-7):H01L21/321 主分类号 H01L21/02
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