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发明名称
Method and means for measuring x-ray diffraction patterns
摘要
申请公布号
US2386785(A)
申请公布日期
1945.10.16
申请号
US19420452599
申请日期
1942.07.28
申请人
HERBERT FRIEDMAN
发明人
FRIEDMAN HERBERT
分类号
H01J47/08
主分类号
H01J47/08
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代理人
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