PROBE NEEDLE FOR PROBE CARD TO PREVENT SMALL QUANTITY OF MARKS OF PROBE NEEDLE

摘要

PURPOSE: A probe needle for a probe card is provided to prevent a relatively small quantity of marks of a probe needle from being left in a direction that the probe needle slides in an EDS(electrical die sorting) process by making a contact end of the probe needle have an angle not greater than 90 degrees with respect to the main body of the probe needle. CONSTITUTION: The probe needle(10) has the main body coupled to the probe card and the contact end(20) coupled to a pad(210) on a semiconductor wafer(200) such that the contact end is extended from the end of the main body. The contact end is bent at an angle not greater than 90 degrees with respect to the main body.