发明名称 Method and apparatus for improved testing of optical circuit modules
摘要 A novel method and apparatus has been developed for testing optical circuit modules. More particularly, with the present invention, a given test pack is adapted to "simultaneously" test a plurality of DUT's, by simultaneously apply a given optical signal to each of the plurality of DUT's and allowing each of the DUT's to simultaneously undergo its own testing; the test pack then serially queries each of the DUT's to obtain test results and, if desired, can provide feedback to one or more of the DUT's, whereby the DUT's can be calibrated with the assistance of the test pack. In one preferred form of the invention, all of the plurality of DUT's simultaneously undergoing testing on a given test pack are housed in a single environmental enclosure, permitting all of the DUT's to be simultaneously brought "up to temperature" so as to increase testing throughput.
申请公布号 US6784984(B2) 申请公布日期 2004.08.31
申请号 US20020112210 申请日期 2002.03.29
申请人 NORTEL NETWORKS, LTD. 发明人 PARENTE RONALD N.;BOYD PAUL;BOTROS DAVID F.;LISON PETER K.
分类号 G01M11/00;(IPC1-7):G01N21/00 主分类号 G01M11/00
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