发明名称 High dopant concentration diffused resistor and method of manufacture therefor
摘要 The present invention provides a high dopant concentration diffused resistor, a method of manufacture therefor, and an integrated circuit including the same. In one embodiment of the invention, the high dopant concentration diffused resistor includes a doped tub located over a semiconductor substrate and a doped resistor region located in the doped tub, the doped resistor region forming a junction within the doped tub. In a related embodiment, the high dopant concentration diffused resistor further includes first and second terminals each contacting the doped tub and the doped resistor region, wherein the first and second terminals cause the doped tub and doped resistor region to have a zero potential difference at any point across the junction when a voltage is applied to the first and second terminals.
申请公布号 US6784044(B2) 申请公布日期 2004.08.31
申请号 US20030669398 申请日期 2003.09.24
申请人 AGERE SYSTEMS INC. 发明人 LAKSHMIKUMAR KADABA R.
分类号 H01L27/06;H01L29/8605;(IPC1-7):H01L21/823;H01L21/823;H01L21/20;H01L29/00;H01L31/119 主分类号 H01L27/06
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