| 摘要 |
PROBLEM TO BE SOLVED: To solve a problem that incidence efficiency is reduced when a low energy beam emitted from an ion source is transported to a beam incident port of a circular accelerator through a beam transport system because the beam is influenced by a leaking magnetic field and deflected since the beam transport system passes between electromagnets constituting the circular accelerator, to prevent the beam from being influenced by the leaking magnetic field by deflecting and injecting the beam in a direction perpendicular to the circular accelerator. SOLUTION: In this circular accelerator, a charged beam is circulated and accelerated, and the beam transport system is provided in a plane vertical to a circulating beam orbital plane of the circular accelerator, and not influenced by the leaking magnetic field. COPYRIGHT: (C)2004,JPO&NCIPI
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