发明名称 Identifying line width errors in integrated circuit designs
摘要 A method of identifying line width errors in an integrated circuit design includes adding a line width marker for each of a plurality of lines on a schematic, each line having a schematic line width, creating a layout from the schematic, the layout containing the line width markers and a plurality of layout widths, checking the layout line widths versus the schematic line widths for the plurality of line width marked lines, creating a design representing the layout, the design having a plurality of design line widths, and checking the design line widths versus the layout line widths for the plurality of line width marked lines.
申请公布号 US2004168139(A1) 申请公布日期 2004.08.26
申请号 US20040782450 申请日期 2004.02.19
申请人 MICRON TECHNOLOGY, INC. 发明人 CHEVALLIER CHRISTOPHE;ABABEI ADRIANA
分类号 G06F17/50;(IPC1-7):G06F17/50;G06F9/45 主分类号 G06F17/50
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