| 摘要 |
PROBLEM TO BE SOLVED: To efficiently test an optical switch for shortening test time and to reduce the amount of data regarding the test result of the optical switch for decreasing capacity for storage. SOLUTION: A light source 2 supplies a light signal to the optical switch 100. In the output of the optical switch 100, a light reception level is detected by a photodetector 3. A control unit 4 changes the amount of control in deflection for changing the angle of a tilt mirror of the optical switch 100 for outputting to a drive section 6. When an input port is the same as an output one, the optical offset of the tilt mirror is calculated, based on an angle, where the photodetector 3 detects an optimum point in the reception level. Contrarily, each time when the input port differs from the output one, the structure parameter of the tilt mirror is calculated, based on the calculated optical offset and the angle, where the photodetector 3 detects the optimum point at the reception level. The optical offset and the structure parameter are stored into a memory 5 as a test result. COPYRIGHT: (C)2004,JPO&NCIPI
|
