发明名称 X-RAY FOREIGN SUBSTANCE INSPECTION APPARATUS
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an X-ray foreign substance inspection apparatus for easily and accurately masking an image of edges of a packaging container such as a box etc. and stably enhancing accuracy for detecting foreign substances. <P>SOLUTION: X-ray transmission images of the edges E<SB>R1</SB>, E<SB>R2</SB>have gray levels and widths equal to sides E<SB>P1</SB>, E<SB>P2</SB>in a carrying direction and a masking process is facilitated by radiating a fan beam X ray from an X-ray source 1 to a test subject W carried on a conveyer 3. The X ray is inclined and not orthogonal to the carrying direction. An X-ray transmission direction to the edges E<SB>R1</SB>, E<SB>R2</SB>of the sides orthogonal to the carrying direction among four sides of the box B is inclined. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p>
申请公布号 JP2004239753(A) 申请公布日期 2004.08.26
申请号 JP20030029249 申请日期 2003.02.06
申请人 SHIMADZU CORP 发明人 ISHIGURO SHUHEI
分类号 G01N23/04;(IPC1-7):G01N23/04 主分类号 G01N23/04
代理机构 代理人
主权项
地址