发明名称 INSTRUMENT AND METHOD FOR MEASURING GAS CONCENTRATION
摘要 PROBLEM TO BE SOLVED: To precisely and inexpensively measure the gas concentration of on a substrate surface in a micro-area under a microscope, as to the sublimable raw material gas. SOLUTION: The temperature of a cooling unit 9 is set to a supersaturated temperature of the material gas, a substrate 8 is irradiated with a laser beam 71 under a supersaturated condition to start condensation of the gas, the temperature of the cooling unit 9 is set thereafter to a temperature near the saturation temperature of the gas, a growth direction of a condensation crystal 10 to the temperature of the substrate 8 is measured, the saturation temperature of the gas is determined based on the measured result in the growth direction, and the concentration of the gas is found based on the saturation temperature and the vapor pressure-temperature characteristics of the gas. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004239756(A) 申请公布日期 2004.08.26
申请号 JP20030029351 申请日期 2003.02.06
申请人 NEC CORP 发明人 MORISHIGE YUKIO
分类号 G01N25/02;G01N25/68;(IPC1-7):G01N25/02 主分类号 G01N25/02
代理机构 代理人
主权项
地址