发明名称 |
WAFER HOLDING BODY FOR SEMICONDUCTOR MANUFACTURING DEVICE AND SEMICONDUCTOR MANUFACTURING DEVICE MOUNTED WITH THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a wafer holding body for semiconductor manufacturing device having a wafer holding surface improved in soaking property, and to provide a semiconductor manufacturing device mounted with the holding body. SOLUTION: A shaft which supports the wafer holding body having the wafer mounting surface is joined to the wafer holding body. When the surface roughness of the other surface than the joining surface of the shaft for the wafer holding device is adjusted to≤5μm in Ra, the temperature distribution on the wafer holding surface can be controlled to≤±1.0%. In addition, it is preferable to adjust the surface roughness to≤2μm in Ra. COPYRIGHT: (C)2004,JPO&NCIPI |
申请公布号 |
JP2004241599(A) |
申请公布日期 |
2004.08.26 |
申请号 |
JP20030028960 |
申请日期 |
2003.02.06 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
NATSUHARA MASUHIRO;NAKADA HIROHIKO;HASHIKURA MANABU;HIIRAGIDAIRA HIROSHI |
分类号 |
H05B3/74;C23C16/44;H01L21/68;H01L21/683;(IPC1-7):H01L21/68 |
主分类号 |
H05B3/74 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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