发明名称 CIRCUIT AND METHOD FOR DEFECT DETECTION
摘要 PROBLEM TO BE SOLVED: To determine the width of a defect while taking an influence of the defect on pixels adjacent to defective pixels into consideration. SOLUTION: When a digital video signal is inputted from a solid-state imaging element 20; video information is temporarily stored in a video information storage part 11, and an output level is compared by a comparison part 13 with a threshold given by a threshold setting part 12. When the output level exceeds the threshold; a count part 14 counts pixels corresponding to the video signal as defect pixels, the defect width is expanded according to output levels of the defective pixels, and a recording part 15 writes the video information and the defect width of the defective pixels held in the video information storage part 11 as defect information to a recording medium 30. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004241600(A) 申请公布日期 2004.08.26
申请号 JP20030028987 申请日期 2003.02.06
申请人 SONY CORP 发明人 HARA MANABU;NISHIDE YOSHIAKI
分类号 H01L27/14;H04N5/335;H04N5/367;(IPC1-7):H01L27/14 主分类号 H01L27/14
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