发明名称 Semiconductor device and manufacturing method thereof
摘要 There are provided a structure of a semiconductor device in which low power consumption is realized even in a case where a size of a display region is increased to be a large size screen and a manufacturing method thereof. A gate electrode in a pixel portion is formed as a three layered structure of a material film containing mainly W, a material film containing mainly Al, and a material film containing mainly Ti to reduce a wiring resistance. A wiring is etched using an IPC etching apparatus. The gate electrode has a taper shape and the width of a region which becomes the taper shape is set to be 1 mum or more.
申请公布号 US2004164296(A1) 申请公布日期 2004.08.26
申请号 US20030718584 申请日期 2003.11.24
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD., A JAPAN CORPORATION 发明人 YAMAZAKI SHUNPEI;SUZAWA HIDEOMI;KUSUYAMA YOSHIHIRO;ONO KOJI;KOYAMA JUN
分类号 H01L29/786;G02F1/1362;H01L21/77;H01L21/84;H01L27/12;(IPC1-7):H01L29/04;H01L21/00 主分类号 H01L29/786
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