发明名称 WIRE USING DAMASCENE PROCESS, METHOD FOR FORMING THE SAME, SEMICONDUCTOR DEVICE INCLUDING THE SAME, AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A wire using damascene process, a method for forming the same, a semiconductor device including the same, and a method for fabricating a semiconductor device are provided to fabricate stably a contact plug by forming a conductive wire such as a bit line. CONSTITUTION: The first insulating layer pattern is formed on a surface of a semiconductor substrate(200) and includes the first pad and the second pad. The second insulating layer pattern is formed on the surface of the first insulating layer pattern and includes a groove or a plurality of trenches. The first conductive patterns are formed within the groove or the trenches. The first conductive patterns are electrically connected to the first pad. The first and the second insulating layer patterns include one oxide selected from a group including silicon oxide, HDP oxide, high-temperature oxide, middle-temperature oxide, and TEOS.
申请公布号 KR20040074355(A) 申请公布日期 2004.08.25
申请号 KR20030009926 申请日期 2003.02.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, GIL HYEON;KANG, SANG BEOM;KIM, HYEON SU;MUN, GWANG JIN;PARK, HUI SUK;YANG, SEUNG GIL
分类号 H01L21/28;H01L21/60;H01L21/768;H01L21/8242;H01L29/40 主分类号 H01L21/28
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