发明名称 Halftone phase shifting photomask and blanks for halftone phase shifting photomask therefor and a method for forming pattern by using the halftone phase shifting photomask
摘要 In a halftone phase shifting photomask 108, having a pattern of halftone phase shifting film 102 containing at least chromium and fluorine, the halftone phase shifting film is heat-treated at a temperature between 250� C. and 500� C. so that a change of the optical property of the film produced by the application of excimer laser for exposure to the film is decreased.
申请公布号 US6780547(B2) 申请公布日期 2004.08.24
申请号 US20010825578 申请日期 2001.04.03
申请人 DAINIPPON PRINTING CO., LTD.;SEMICONDUCTOR LEADING EDGE TECHNOLOGIES, INC. 发明人 MOTONAGA TOSHIAKI;ITO NORIHITO;HATSUTA CHIAKI;FUJIKAWA JUNJI;HAYASHI NAOYA;ONODERA TOSHIO;MATSUO TAKAHIRO;OGAWA TORU;NAKAZAWA KEISUKE
分类号 G03F1/08;G03F1/00;G03F1/32;G03F1/68;H01L21/027;(IPC1-7):G03F9/00 主分类号 G03F1/08
代理机构 代理人
主权项
地址