发明名称 Methods of forming magnetoresistive memory devices
摘要 The invention includes a method of forming a magnetoresistive memory device. A trench is formed in an insulative material, and the trench is partially filled with a first magnetic material to narrow the trench. The narrowed trench is at least partially filled with a conductive material. A second magnetic material is formed over the conductive material. A non-magnetic layer is formed over the second magnetic material. A third magnetic material is formed over the non-magnetic layer. The conductive material and the first and second magnetic materials are incorporated into a sense portion of the magnetoresistive memory device. The third magnetic material is incorporated into a reference portion of the magnetoresistive memory device.
申请公布号 US6780655(B2) 申请公布日期 2004.08.24
申请号 US20030632579 申请日期 2003.07.31
申请人 MICRON TECHNOLOGY, INC. 发明人 MATTSON JOHN
分类号 G11C11/00;G11C11/16;H01L21/00;H01L27/22;H01L29/76;H01L29/82;H01L31/119;H01L43/00;H01L43/08;(IPC1-7):H01L21/00 主分类号 G11C11/00
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