发明名称 Method and apparatus for accessing internal nodes of an integrated circuit using IC package substrate
摘要 A method and apparatus for accessing internal nodes of an integrated circuit using a package substrate are provided. Embodiments of the present invention include an integrated circuit comprising an integrated circuit die comprising a principal side; a conductive element formed on the principal side of the integrated circuit die; a package substrate comprising a principal side facing the principal side of the integrated circuit die; a conductive element located on the principal side of the package substrate; a transmission path wherein a first end of the transmission path is coupled to the conductive element of the integrated circuit die and wherein a second end of the transmission path is coupled to the conductive element of the package substrate.
申请公布号 US6781218(B1) 申请公布日期 2004.08.24
申请号 US20030382343 申请日期 2003.03.04
申请人 NPTEST, INC. 发明人 WILSHER KENNETH
分类号 H01L23/58;(IPC1-7):H01L39/00 主分类号 H01L23/58
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