发明名称 LIQUID CRYSTAL SUBSTRATE INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To save the labor and time required for manual prober exchanging work, to shorten the time required for stopping an inspection line for inspecting a liquid crystal substrate, and to save the space required for installing a rack used for keeping probers. SOLUTION: A liquid crystal substrate inspection device 1 is constituted to arrange an inspecting section (load lock chamber 11) which inspects the liquid crystal substrate 30 and a prober exchanger 10 which exchanges probers 6 used for inspecting the substrate 30 side by side and, at the same time, to make the prober exchanger 10 to be provide with a rack 2 used for keeping the probers 6. When the inspecting section and prober exchanger 10 are arranged side by side in this way, the inspection time of the liquid crystal substrate 30 can be shortened. In addition, when the prober exchanger 10 is used as the rack 2 for keeping the probers 6, the space required for installing the rack 2 can be saved. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004233141(A) 申请公布日期 2004.08.19
申请号 JP20030020371 申请日期 2003.01.29
申请人 SHIMADZU CORP 发明人 TANAKA TAKESHI;TERAMOTO AKIRA;SHINOHARA MAKOTO
分类号 G01R31/00;(IPC1-7):G01R31/00 主分类号 G01R31/00
代理机构 代理人
主权项
地址