发明名称 GAS ANALYSIS METHOD AND GAS ANALYSIS SYSTEM
摘要 PROBLEM TO BE SOLVED: To suppress degradation of the detection sensitivity caused by residues such as high boiling point organic compounds on a surface of an oscillator. SOLUTION: In a gas analysis method in which sample gas containing organic compounds for analysis is introduced in a measurement chamber 13 having an oscillator, the frequency of the oscillator 11 is measured in a state in which the organic compounds are deposited on a surface of the oscillator 11 and in a state in which the organic compounds are separated from the surface by heating, and the deposition of the organic compounds is calculated, the change of the frequency is measured, and a solvent is fed to the surface of the oscillator 11 to dissolve and remove the residues on the surface of the oscillator 11. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004233069(A) 申请公布日期 2004.08.19
申请号 JP20030018603 申请日期 2003.01.28
申请人 BABCOCK HITACHI KK 发明人 HIROTA TAKESHI;TOMINAGA SHIGERU
分类号 G01N5/02;(IPC1-7):G01N5/02 主分类号 G01N5/02
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