发明名称 Checking layout accuracy in integrated circuit designs
摘要 A method for checking layout accuracy in an integrated circuit design includes creating a schematic, adding a line width marker to selected lines having a width greater than an absolute minimum width, and assigning a line width to each line width marker. A layout is created and is checked versus the schematic. A design is extracted from the layout. The design has a design line width corresponding to each line having a line width marker. The design line width is checked versus the marker line width for each line having a line width marker.
申请公布号 US2004163062(A1) 申请公布日期 2004.08.19
申请号 US20040782247 申请日期 2004.02.19
申请人 MICRON TECHNOLOGY, INC. 发明人 CHEVALLIER CHRISTOPHE;ABABEI ADRIANA
分类号 G06F17/50;(IPC1-7):G06F9/45 主分类号 G06F17/50
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