发明名称 |
Checking layout accuracy in integrated circuit designs |
摘要 |
A method for checking layout accuracy in an integrated circuit design includes creating a schematic, adding a line width marker to selected lines having a width greater than an absolute minimum width, and assigning a line width to each line width marker. A layout is created and is checked versus the schematic. A design is extracted from the layout. The design has a design line width corresponding to each line having a line width marker. The design line width is checked versus the marker line width for each line having a line width marker.
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申请公布号 |
US2004163062(A1) |
申请公布日期 |
2004.08.19 |
申请号 |
US20040782247 |
申请日期 |
2004.02.19 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
CHEVALLIER CHRISTOPHE;ABABEI ADRIANA |
分类号 |
G06F17/50;(IPC1-7):G06F9/45 |
主分类号 |
G06F17/50 |
代理机构 |
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