| 摘要 |
PROBLEM TO BE SOLVED: To solve problems that an inspection apparatus becomes difficult to develop by following a multi-pin type and an inspection time becomes long when inspecting a liquid crystal driving LSI under progress of the multi-pin type composed of 1,000 or more pins. SOLUTION: In the semiconductor circuit device and its inspection method, an analog memory is packaged in a power output of the liquid crystal driving LSI, a liquid crystal driving voltage is accumulated in the memory and the data are successively transmitted by an analog shift circuit, thereby remarkably reducing the inspection time. COPYRIGHT: (C)2004,JPO&NCIPI
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