| 摘要 |
PROBLEM TO BE SOLVED: To provide a thermal type infrared solid-state imaging element of less signal drift caused by fluctuation in element temperature or in power supply voltage. SOLUTION: A bias line 11 of an integration circuit 7 is subjected to common connection, and a reference signal to be changed according to fluctuation in element temperature or power supply voltage is input in the bias line 11. Drift portion caused by the fluctuation in element temperature and power supply voltage is input in both a gate and a source of an integration transistor constituting the integration circuit 7, and eliminated from the output. The reference signal input in the bias line 11 is generated by a reference pixel 19 which is connected to a same power source 6 as that of pixels to detect only the fluctuation in element temperature, and adjusted to the optimum voltage by a level shift circuit and a low pass filter in a bias power supply circuit 21, and noises are eliminated thereby. COPYRIGHT: (C)2004,JPO&NCIPI
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