An assembly for an LSI test supplies a test signal output from an LSI tester to a target LSI (12) to be tested and outputs, to the LSI tester (2), a test result signal generated by processing of the target LSI performed in accordance with the test signal. The assembly for an LSI test includes: a peripheral circuit (24) coupled to the target LSI (12) and allowing the target LSI to operate in the same manner as in the application environment; and a printed circuit board (40) on which the peripheral circuit is mounted. <IMAGE>
