发明名称 SONOS MEMORY CELL AND FABRICATING METHOD THEREOF
摘要 PURPOSE: A SONOS memory cell and a fabricating method thereof are provided to improve operating speed by forming a charge storage insulating layer only on a charge trap insulating region. CONSTITUTION: A source region and a drain region are formed on a predetermined region of a semiconductor substrate(50). A channel region(76) is defined between the source region and the drain region. A charge storage insulating layer is formed on an edge of the channel region adjacent the source region and the drain region. A gate insulating layer(64) is formed on the channel region between charge trap insulating layers(72). A gate electrode(70) is formed on the gate insulating layer and the charge trap insulating layer.
申请公布号 KR20040072342(A) 申请公布日期 2004.08.18
申请号 KR20030008791 申请日期 2003.02.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUN, HUI SEOK;KIM, JAE HWANG
分类号 H01L21/8247;H01L21/28;H01L21/336;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 主分类号 H01L21/8247
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