发明名称 |
SONOS MEMORY CELL AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A SONOS memory cell and a fabricating method thereof are provided to improve operating speed by forming a charge storage insulating layer only on a charge trap insulating region. CONSTITUTION: A source region and a drain region are formed on a predetermined region of a semiconductor substrate(50). A channel region(76) is defined between the source region and the drain region. A charge storage insulating layer is formed on an edge of the channel region adjacent the source region and the drain region. A gate insulating layer(64) is formed on the channel region between charge trap insulating layers(72). A gate electrode(70) is formed on the gate insulating layer and the charge trap insulating layer.
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申请公布号 |
KR20040072342(A) |
申请公布日期 |
2004.08.18 |
申请号 |
KR20030008791 |
申请日期 |
2003.02.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUN, HUI SEOK;KIM, JAE HWANG |
分类号 |
H01L21/8247;H01L21/28;H01L21/336;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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