发明名称 |
SEMICONDUCTOR DECAPPING APPARATUS AND DECAPPING METHOD USING THE SAME |
摘要 |
PURPOSE: A semiconductor decapping apparatus and a decapping method using the same are provided to enhance the productivity of semiconductors by decapping only a desired die. CONSTITUTION: A wafer is loaded on a wafer fixing plate. An anti-pollution layer(40) is used for surrounding a decapping die. A supporter(10) is used for supporting the wafer fixing plate. An air gun(70) is installed at a lower side of the wafer fixing plate and an upper part of the supporter. A grinder supporter is installed at an upper part of one side of the supporter and is spread to an upper part of the wafer loaded on the wafer fixing plate. A grinder(50) is adhered to an upper part of one side of the grinder supporter and is located within the anti-pollution layer. A nozzle(60) is close to one side of the grinder and is located within the anti-pollution layer.
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申请公布号 |
KR20040072349(A) |
申请公布日期 |
2004.08.18 |
申请号 |
KR20030008799 |
申请日期 |
2003.02.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
RYU, JEONG SU |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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