发明名称 |
Method and magazine device for testing semiconductor devices |
摘要 |
A method and device allow testing functionally identical semiconductor devices on a programmable testing device. The semiconductor devices are placed in magazine devices and a uniform magazine interface with respect to the testing device is provided for similar semiconductor devices in different types of packages. The semiconductor devices are advantageously tested one after the other on a testing device essentially without deference to their type of package and without any mechanical conversions being necessary on the testing device.
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申请公布号 |
US6777924(B2) |
申请公布日期 |
2004.08.17 |
申请号 |
US20030377348 |
申请日期 |
2003.02.28 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
FLACH BJOERN;RUF WOLFGANG;SCHNELL MARTIN;STIPPLER JOERG;LOGISCH ANDREAS |
分类号 |
G01R31/28;(IPC1-7):G01R1/04;G01R31/26 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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