发明名称 Base-to-substrate leakage cancellation
摘要 The operating temperature range for a vertical PNP transistor can be extended by applying cancellation techniques. The vertical PNP generates a first leakage current from the base-collector region. Another vertical PNP transistor is configured to generate a second leakage current, which is coupled to a current-mirror circuit. The output of the current-mirror circuit is configured to provide a cancellation effect on the first leakage current. The current-mirror circuit and vertical PNP may be configured such that the first leakage current is cancelled in a judicious amount, whereby the effects of leakage current and flare-out in the vertical PNP transistor are minimized or cancelled. The cancellation technique is applicable to temperature sensor circuits, thermal voltage generators, and bandgap circuits.
申请公布号 US6777781(B1) 申请公布日期 2004.08.17
申请号 US20030413955 申请日期 2003.04.14
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 LORENZ PERRY SCOTT
分类号 H01L21/761;H01L27/082;(IPC1-7):H01L27/082 主分类号 H01L21/761
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